Dual beam SEM/FIB electron microscope (FEG and gallium ions) equipped with detectors for secondary (SE) and back-scattered (BSE, DBS) electrons and for ions (ICE). Additionally, the microscope is equipped with a Quorum cryo-station for vitrification of biological samples and with a cryo-stage for transfer of vitrified samples and TEM autogrids into the microscope at cryogenic temperatures. Platinum coating of specimen is available both in the cryo-stage and in the microscope.
+420 54949 3893
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